An optical reflectance spectrometer, for the characterization of films, has been installed on the premises of the Unit. By using the white light reflectance spectroscopy (WLRS) method the optical characteristics of films can be measured in the UV/VIS range (200-850nm). The system will enhance the activities of the nanoscale characterization pillar on the optical measurements front.
ORS installed
Nanostructured Materials Systems
Centre of Excellence for Materials Research
Nanostructured Materials Systems
26/06/2013 17:55
Σχετικοί Σύνδεσμοι
Congratulations to Marios Constantinou for receiving Best Student Presentation Award at the Panhellenic Conference on Solid State Physics and Materials Science
Congratulations to Marios Constantinou for receiving Best Student Presentation Award at the Panhellenic Conference on Solid State Physics and Materials Science
Congratulations to Sergey Pozov for receiving 1st Prize in the RPF competition «ΦΟΙΤΩ 2016»
Congratulations to Sergey Pozov for receiving 1st Prize in the RPF competition «ΦΟΙΤΩ 2016»
Prof. Kelires has joined the Editorial Board of Scientific Reports - a Journal from the publishers of Nature
